HiCONNECTS publications are subject to ‘open access’ and available freely.

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Enabling MOCVD production on next generation 150 mm Indium Phosphide wafer size I. Miccoli, G. Simkus, H. Larhirb, T. Korst, M. Mukinovic, J. Holzwarth, M. Heuken AIXTRON Journal of Crystal Growth 2024 Enabling MOCVD production on next generation 150 mm Indium Phosphide wafer size – ScienceDirect
A new composite heuristic to minimize the total tardiness for the single machine scheduling problem with variable and flexible maintenance A. Costa, V. Fernandez-Viagas, R.R. Corsini, D. Pagano University of Catania, University of Seville, STMicroelectronics Italy Computers & Operations Research Journal 2025 A new composite heuristic to minimize the total tardiness for the single machine scheduling problem with variable and flexible maintenance – ScienceDirect
Active Inference Meeting Energy-Efficient Control of Parallel and Identical Machines Yavar Taheri Yeganeh, Mohsen Jafari, Andrea Matta Politecnico di Milano  10th International Conference on Machine Learning, Optimization, and Data Science 2024 [2406.09322] Active Inference Meeting Energy-Efficient Control of Parallel and Identical Machines
Dual DFB for Uncooled 40 Gbps and Cooled 72 Gbps Direct Modulation G. Vasudevan Rajeswari; M. Moehrle; A. Sigmund; M. Schell Fraunhofer HHI 2024 IEEE 29th International Semiconductor Laser Conference 2024 Dual DFB for Uncooled 40 Gbps and Cooled 72 Gbps Direct Modulation | IEEE Conference Publication | IEEE Xplore
Comparing dispatching rules for minimizing the total weighted tardiness in the cleaning-diffusion manufacturing stag Roberto Rosario Corsini; Antonio Costa; Giuseppe Oriti; Sergio Fichera; Daniele Vinciguerra; Marco Stefano Scroppo University of Catania, STMicroelectronics Italy 2024 IEEE 20th International Conference on Automation Science and Engineering 2024 Comparing dispatching rules for minimizing the total weighted tardiness in the cleaning-diffusion manufacturing stage | IEEE Conference Publication | IEEE Xplore
Smart Device on Facilities to prevent unscheduled facilities interruption ST-I, CoreTigo, Horsa ST-I, CoreTigo, Horsa APMC Europe conference 2024 Available as conference proceedings
AI-Enhanced Digital Twin Architecture and local dispatching
methods for yield improvement in a microelectronics facility
UNICT, POLIMI, ST-I UNICT, POLIMI, ST-I APMC Europe conference 2024 Available as conference proceedings
Dynamic dispatching and batching in the diffusion work area of semiconductor manufacturing systems UNICT, ST-I UNICT, ST-I STOCHMOD 2024 2024 Available as conference proceedings
Process and Equipment Performance Optimization ST-I, POLITO ST-I, POLITO APMC Europe conference 2024 Available as conference proceedings
Equipment Performance Optimization for Yield improvement ST-I, SEDA, UNICT ST-I, SEDA, UNICT APMC Europe conference 2024 Available as conference proceedings
Energy-Efficiency Control of Manufacturing Systems via Active Inference Taheri Yeganeh, Y., Jafari, M., & Matta, A. Polimi International Conference on Stochastic Models of Manufacturing and Service Operations 2024 https://www.smmso2024.it/papers/18.pdf
Reinforcement learning for planning and control in wafer fabs M.Shekari, D.Pagano, A.Matta Polimi, ST-I Dagstuhl Seminar 23362 Decision-Making Techniques for Smart Semiconductor Manufacturing 2024 Seminar Proceedings
Metaheuristic Approaches For Solving The Scheduling Problem In The Semiconductor Diffusion Work Area R.R Corsini, A Costa, V Fichera UNICT XVII Convegno AITEM 2025 Available as conference proceedings
A Mathematical Modeling Approach For Job Allocation In The Semiconductor Industry El Achkar Elias, F Nicla, D Pagano, A Matta Polimi, ST-I XVII Convegno AITEM 2025 Available as conference proceedings
Deep Reinforcement Learning For Lot/Batch Dispatching In The Cleaning-Diffusion Work Area  A.Costa, L.Longo, S.Fichera, R.R Corsini , D.Pagano, A.M.Stivala, R.Messina UNICT, ST-I 23rd European Advanced Process Control and Manufacturing Conference (apc|m), Prague, Czech Republic  2025 Available as conference proceedings
SMART devices development  G.Fazio, F.Panzeri, P.Giugni, C.Rossi, A.Bassi, D.Pagano, S.Sau, A.Scorza, G.Lussana, D.Alon, O.Levi, C.Tarricone, M.Irsheid  ST-I, CoreTigo, Horsa 23rd European Advanced Process Control and Manufacturing Conference (apc|m), Prague, Czech Republic  2025 Available as conference proceedings
Advanced process control to estimate as accurately as possible the equipment parameters and endpoint trace to detect possible anomalies or drift on equipment process performance  P.Petruzza, M.Ravasio, G.Fazio, B.A.Motetti, F.Daghero, M.Poncino, A.Burrello   Polito, ST-I 23rd European Advanced Process Control and Manufacturing Conference (apc|m), Prague, Czech Republic  2025 Available as conference proceedings